Immunity Prediction of Integrated Circuits using ……

1、IEC 47A- WG2, 2007 alexandre.boyerinsa-toulouse.fr - Immunity Prediction of Integrated Circuits using IC-EMCEtienne SICARD, Alexandre BOYERalexandre.boyerinsa-toulouse.frIEC 47A WG2 Toulouse Nov 2007INSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - www.ic-emc.o

2、rgCreditsqEuropean project MEDEA+ “Parachute” (2005-2007)qEuropean project PIDEA+ “EMCPack” (2006-2008)qFrench project Aerospace-Valley “EPEA” (2007-2010)INSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 1. IC Immunity issues2. What is IC-EMC3. Susceptibility Prediction4. Case Stu

3、dy S12X5. ConclusionSummaryINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - Frequency 1 GHz 10 GHz Ultra-High Frequencies Super High Frequencies Multimedia Wireless 100 MHz UNII band (5.8GHz) Tremendously High Frequencies Very-High Frequencies Application GSM DCS UMTS FM DVB WiF

4、i, Bluetooth 2.45GHz IEEE 802.11a (5.4GHz) Future RF systems 100 GHz Tire Pressure 433 MHz GPS 1.2 GHz Radars for cruise control 24, 48, 66 GHz Clock data rate UWB 4.2-6.0 GHz PCA ? Serial-ATA ? 1. IC Immunity IssuesMore interference sourcesINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - www.

5、1. IC Immunity Issues199520002005201020150.1V1V10VSupply voltageYear0.25m0.18m 0.13m90nm65nm45nm32nmExternal voltageInternal voltage10% Noise margin18 nm22 nmINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - Technology scale down2000200520102015lowmediumhighImmunity leve

6、l2020very lowvery highIC Customer requestCustomer pressureIC perf without guidelinesIC perf with guidelines10 dBIC provider customer gapR&D needed1. IC Immunity IssuesINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 72/22/2022DESIGNArchitectural DesignDesign EntryDesign Archi

7、tectFABRICATIONEMC compliantEMC SimulationsCompliance ?GONO GOImmunity must be validated before fabricationDesign GuidelinesToolsTraining1. IC Immunity IssuesModelsINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - qA simple tool dedicated to predict EMC of ICsAn electric circuit s

8、chematic editorAn interface to WinSpice analog simulatorA set of post-processing toolsqA library of EMC/IC elementsqA set of EMC-related goodies A demonstrator for predicting EMC of integrated circuits2. What is IC-EMC INSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - qDeveloped w

9、ithin MEDEA+ “Parachute” (2005-2007), PIDEA+ EMCPack (2006-2008), EPEA (2007-2010)qIC foundries & customers support the tool development and publishingqPromotes and defends the “European” vision of EMC of ICsWhy is it free?Why is it non-confidential?qStandard-based tool : IBIS (IEC 62014-1), ICE

10、M (IEC 62014-3), SPICEqIntegrated Circuit parameters & models from ITRS roadmapqEases industrial exchanges between IC customers and providers2. What is IC-EMCINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - IC, package and PCB modelBasic symbolsElectric circuit schematic edit

11、or2. What is IC-EMCMain analysisSpice Simulation Spectrum analysis Impedance simulation Near-field simulationImmunity simulation IBIS interface Post-processing toolsINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 3. Susceptibility Prediction Only for harmonic disturbances, not f

12、or transient immunity Should predict conducted, radiated mode and near-field susceptibility Should use one single core and IO model for all methods Should be non-confidential and based on standards Recently added to IC-EMCDirect Power InjectionNear-field ImmunityTarget Measurement MethodsRadiated im

13、munity in GTEMINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 3. Susceptibility PredictionSusceptibility Simulation flowAggressed IC Model (ICEM)Package and IO model (IBIS)RFI and coupling path model (Z(f)Set RFI frequencyIC-EMCIncrease V aggressorTime domain simulationWinSPICEC

14、riterion analysisExtract forward powerIC-EMCIncrease RFI frequencySusceptibility threshold simulationINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 3. Susceptibility Prediction 30221log1022incinincincforwardIimagZVimagIrealZVrealZP30221log1022incinincincreflectedIimagZVimagIrea

15、lZVrealZPKey role of Coupler : from I,V to powerINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 3. Susceptibility PredictionExample : DPI on 330 ohm load, 1V criterionINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 3. Susceptibility PredictionStepDetails1. S

16、et the RFI source parameters100-MHz frequency, a voltage from 0 to 10 V, duration of 1 s.2. Set the susceptibility criterionFail Criterion : 1.0V in the control interface. 3. SimulateClick “Generate Spice”. Launch WinSPICE .4. Extract the powerClick “Get Power” to extract the forward power.5. Save t

17、he power valueClick “Add Forward Power” to add the extracted valueStep-by-step procedureINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 3. Susceptibility PredictionMeasurement/Simulation on 330 ohm load, 1V criterionOver 1.0VIterative, time-consuming approachINSA Toulouse FRANCE

18、 alexandre.boyerinsa-toulouse.fr - 4. Case Study S12X RAM Memory Flash Memory S12X CPU XGATE Timer PWM ADC VREG Regulation Dual Port RAM EEPROM Memory VREG Power PLL S12X Structure and PDN model16-bit automotive micro-controller with interrupt coprocessorICEM model including IA, PDN an

19、d external decouplingINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 4. Case Study S12XPforwDirectional couplerPrefl10 W power amplifierSignal synthesizerTest boardMicrocontroller6.8 nF DPI capacitorExternal LEDDPI setup, testboard and macromodelINSA Toulouse FRANCE alexandre.bo

20、yerinsa-toulouse.fr - 4. Case Study S12XInjection Path Model and Impedance ValidationINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - 4. Case Study S12XDPI on IO model 16 bit microcontroller Susceptibility threshold simulationmeasurementsimulationDPI measurement/Sim

21、ulation comparisonINSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - ConclusionqAn environment for immunity prediction at IC level has been developedqThe tool includes the coupler and injection path modelqConducted susceptibility successfully predicted on several ICsqThe model mode

22、l is based on the ICEM approachqThe demonstration tool and manual are online at qDemos at EmcCompo 07, EMC Europe 08, EMC Asia Pacific 08INSA Toulouse FRANCE alexandre.boyerinsa-toulouse.fr - PublicationsE. Sicard Issues in Electromagnetic Compatibility of integrated circuits: Emi