ICT測試介紹課件

ICT測試介紹－Agilent3070生技部TE訓練教材...1.ICT的意義2.ICT測試在生產(chǎn)中的定位3.ICT測試設備4.ICT測試的功能5.ICT測試方法及原理主要內容：...ICT的意義－－In-CircuitTest－－在線測試...產(chǎn)品的一般生產(chǎn)流程ScreenPrintPickPlaceRe-flowThru-HoleLoadWaveSolderingElectricalProcessTestPre-BoardFunctionTestAssemblyFinalFunctionTestBurn-In...各種測試方式的位置ScreenPrintPickPlaceRe-flowThru-HoleLoadWaveSolderingElectricalProcessTestPre-BoardFunctionTestAssemblyFinalFunctionTestBurn-InAOI-2ICTAOI-1Burn-InFinalTestPre-Test...ICT測試設備–Agilent3070...ICT測試設備–TR-518F...ICT測試設備–TR-8001...ICT測試設備–TeradyneZ180...ICT測試設備–GenRadTestStation...ICT測試設備–Jet300...ICT測試的功能◎PCB開短路狀況測試◎無源元件測試 主動元件,被動元件◎有源元件測試 Transistor,IC…...ICT測試的功能CircuitOpenCircuitShortMissingPartsComponentPolarityReverseWrongPartsComponentLeadBent...DigitalICfunctionaltestAnalogICfunctionaltestBoundaryscanOnboardprogrammingFrequencymeasurementVector-lesstestforICICT測試的功能...待測電子元件種類-ICT1,電阻器－Ｒ 2,電位器－Ｐ3,電容器－Ｃ 4,電感－Ｌ5,保險絲－Ｆ 6,二極體－Ｄ7,三極體－Ｑ 8,肖特基二極體－Zener9,場效應管－FET 10,連接器－Connector11,跳線－Jumper 12,開關－Switch13,集成電路－IC...ICT測試－開短路測試測量可以探測的所有的節(jié)點相對於其他所有的節(jié)點的開短路狀況.狀況的良好與否,由GoldenSample的狀況最為標準值來判斷.TestSourcesTestGround...開短路測試測試過程...ICT測試－電阻測試待測試電阻...Agilent3070電阻測試語句電阻測試...Agilent3070電阻測試選項resistorStatementOptions--

Option/DefaultDescription

adadjustcomponent

oxt

overrideadaptivemeasurementsam

am.1sourceamplitude

pf

pass/failar

ar0.156ASRUrange

pm

parallelmodeldwa

dwa0detectorwait

re

re4referenceelemented

extradigit

sa

senseAbusen

enhancement

sb

senseBbusfi

fi1filter

slsenseLbusfr

fr1024frequency

sm

serialmodelico

ico1currentcompliance

wa

wa0waitof

of0voltageoffset

wb

wideband...電阻測試選項一般原則...ICT測試－電容器測試待測試容阻...capacitor<value>,<+tol>,<-tol>,<comp/nocomp>capacitor<value>,<+tol>,<-tol>,<return>,<comp/nocomp>capacitor<value>,<+tol>,<-tol>,<options>,<comp/nocomp>capacitor<value>,<+tol>,<-tol>,<options>,<return>,<comp/nocomp>capacitor<designator>,<value>,<+tol>,<-tol>,<comp/nocomp>capacitor<designator>,<value>,<+tol>,<-tol>,<return>,<comp/nocomp>capacitor<designator>,<value>,<+tol>,<-tol>,<options>,<comp/nocomp>capacitor<designator>,<value>,<+tol>,<-tol>,<options>,<return>,<comp/nocomp>Example:clearconnectsto"C1-1";ito"C1-2",nocompcapacitor2u,11.8,12.4,re2,fr128電容器測試語法...電容器測試選項...電容器測試選項一般原則...ICT測試-電位器測試待測試電位器...potentiometerStatementpotentiometer<value>,<+tol>,<-tol>potentiometer<value>,<+tol>,<-tol>,<return>potentiometer<value>,<+tol>,<-tol>,<options>potentiometer<value>,<+tol>,<-tol>,<options>,<return>potentiometer<designator>,<value>,<+tol>,<-tol>potentiometer<designator>,<value>,<+tol>,<-tol>,<return>potentiometer<designator>,<value>,<+tol>,<-tol>,<options>potentiometer<designator>,<value>,<+tol>,<-tol>,<options>,<return>Example:onfailurereport"PartNum:1145-0217;Location:H2"exittestendonfailureclearconnectsto"R1-1";ito"R1-W"potentiometer"Leg1",5k,12,12,wb,ad,Rclearconnectsto"R1-W";ito"R1-2"potentiometer"Leg2",5k,32,32,wb,ed電位器測試語法...電位器測試選項...電位器測試選項一般原則...ICT測試-電感測試待測試感器...ExampleoftheinductorStatementinductor<value>,<+tol>,<-tol>inductor<value>,<+tol>,<-tol>,<return>inductor<value>,<+tol>,<-tol>,<options>inductor<value>,<+tol>,<-tol>,<options>,<return>inductor<designator>,<value>,<+tol>,<-tol>inductor<designator>,<value>,<+tol>,<-tol>,<return>inductor<designator>,<value>,<+tol>,<-tol>,<options>inductor<designator>,<value>,<+tol>,<-tol>,<options>,<return>Example:clearconnectsto"L1-1";ito"L1-2"inductor70m,10.3,10.1,fr8192,re3電感測試語法...電感測試選項...電感測試選項一般原則...ICT測試-Diode/Zener待測試...diode/zenerStatementsdiode<designator>,<hi>,<lo>,<return>diode<designator>,<hi>,<lo>,<options>diode<designator>,<hi>,<lo>,<options>,<return>Thezenerstatementexecutesazenertest:zener<designator>,<value>,<+tol>,<-tol>,<return>zener<designator>,<value>,<+tol>,<-tol>,<options>zener<designator>,<value>,<+tol>,<-tol>,<options>,<return>Example:clearconnectsto"D1-A";ito"D1-C"diode800m,400m,ar1,idc1m,co2.8Diode/Zener測試語法...Diode/Zener測試選項...ICT測試-Transistor待測試...Transistor測試語法ExampleofthenpnStatementnpn<hi>,<lo>npn<hi>,<lo>,<return>npn<hi>,<lo>,<options>npn<hi>,<lo>,<options>,<return>npn<designator>,<hi>,<lo>npn<designator>,<hi>,<lo>,<return>npn<designator>,<hi>,<lo>,<options>npn<designator>,<hi>,<lo>,<options>,<return>Thepnpstatementexecutesapnptransistortest:pnp<hi>,<lo>pnp<hi>,<lo>,<return>pnp<hi>,<lo>,<options>pnp<hi>,<lo>,<options>,<return>pnp<designator>,<hi>,<lo>pnp<designator>,<hi>,<lo>,<return>pnp<designator>,<hi>,<lo>,<options>pnp<designator>,<hi>,<lo>,<options>,<return>Examples:clearconnectsto"Q1-E";ito"Q1-B";gto"Q1-C"npn200,50,co2.7,idc171.7u,idelta15clearconnectsto"Q1-E";ito"Q1-B"diode"emitter",805m,600m,idc1.0m,co3.0,ar805mclearconnectsto"Q1-C";ito"Q1-B"diode"collector",805m,600m,idc1.0m,co3.0,ar805mclearconnectsto"Q1-E";ito"Q1-B";gto"Q1-C“!npn"gain",200,50,co2.7,idc171.7u,idelta15npn"gain"...Transistor測試選項...待測試ICT測試-FET...ThenfetrstatementexecutesanN-channelFETtest:nfetr<hi>,<lo>nfetr<hi>,<lo>,<return>nfetr<hi>,<lo>,<options>nfetr<hi>,<lo>,<options>,<return>nfetr<designator>,<hi>,<lo>nfetr<designator>,<hi>,<lo>,<return>nfetr<designator>,<hi>,<lo>,<options>nfetr<designator>,<hi>,<lo>,<options>,<return>ThepfetrstatementexecutesaP-channelFETtest:pfetr<hi>,<lo>pfetr<hi>,<lo>,<return>pfetr<hi>,<lo>,<options>pfetr<hi>,<lo>,<options>,<return>pfetr<designator>,<hi>,<lo>pfetr<designator>,<hi>,<lo>,<return>pfetr<designator>,<hi>,<lo>,<options>pfetr<designator>,<hi>,<lo>,<options>,<return>Example:clearconnectsto"Q1-D";ito"Q1-S";gto"Q1-G"nfetr10.24k,4.906k,wb,edFET測試語法...FET測試選項...待測試ICT測試-Fuse...fuseStatementfuse<threshold>fuse<threshold>,<return>fuse<threshold>,<options>fuse<threshold>,<options>,<return>fuse<designator>,<threshold>fuse<designator>,<threshold>,<return>fuse<designator>,<threshold>,<options>fuse<designator>,<threshold>,<options>,<return>Example:clearconnectsto"F1-1";ito"F1-2"fuse10Fuse測試語法...Fuse測試選項...ICT測試-Switch待測試...ExampleoftheswitchStatementswitch<threshold>switch<threshold>,<return>switch<threshold>,<options>switch<threshold>,<options>,<return>switch<designator>,<threshold>switch<designator>,<threshold>,<return>switch<designator>,<threshold>,<op