同創(chuàng)光電科技產(chǎn)品2013近紅外相機320-k datesheet

1、FPA-320 x256-K InGaAs FPA-320 x256-K InGaAs NEARINFRARED(0.9um-1.7um)IMAGEFPA-320 x256-K InGaAs FPA-320 x256-K InGaAs NEARINFRARED(0.9um-1.7um)IMAGE320 x256Array28-etalDIPTypical Pixel Operability 99.5% Quantum Efficiency 70%Near-infrared Imaging Imaging Spectroscopy Covert Surveillance Semiconducto

2、r Inspection MedicalScienceandBiologyAstronomy and Scientific IndustrialThermalImaging Moisture Map西安同創(chuàng)光電科技FPA-320 x256-InGaAs FPACHARACTERISTICS(Ta=25C*PixelOperabilityisdefinedhecenter318x254UMOperationTemperature:-2085C Storage Temperature: -4085C*Withoutdrivingthe西安同創(chuàng)光電科技DarkFPA-320 x256-InGaAs

3、FPACHARACTERISTICS(Ta=25C*PixelOperabilityisdefinedhecenter318x254UMOperationTemperature:-2085C Storage Temperature: -4085C*Withoutdrivingthe西安同創(chuàng)光電科技Dark0.4 Pixelbias=0.1 Quantum =1.0um-FillAdjacentpixel5x1012=16ms,HighGain, ResponseUnder50%Over 10%-90%FullWellMax.PixelHigh:13.3Low:0.7FullLow:3.5MPi

4、xelDark Current 20% Full Well ResponseNonuniformity20%SensorStandardSpectralImagePixel30umx30um(99%FillImagePackage28-etalDIPFPA-320 x256-K InGaAs THERMOELECTRIC COOLER DATA (Without thermal CoolingFPA-320 x256-K InGaAs THERMOELECTRIC COOLER DATA (Without thermal CoolingPerformancewithsensorloadinga

5、nd西安同創(chuàng)光電科技FPA-320 x256-K InGaAs LESisticalHistogramofDarkSisticalHistogramofQuantumQuantumEfficiency 西安同創(chuàng)光電科技TestNonuniformity Array AverageTestNonuniformity FPA-320 x256-K InGaAs LESisticalHistogramofDarkSisticalHistogramofQuantumQuantumEfficiency 西安同創(chuàng)光電科技TestNonuniformity Array AverageTestNonuniformity 5msec,50%Array AverageTestNonuniformity 5msec,50%EffectiveTestEffectiveFPA-320 x256-InGaAs OUTAwaveformunderOUTAwaveformFPA-320 x256-InGaAs OUTAwaveformunderOUTAwavef