GB/T 41869.3-2024光學和光子學微透鏡陣列第3部分：光學特性測試方法

ICS

31.260

CCS

L51

中華人民共和國國家標準

GB/T41869.3—2024

光學和光子學微透鏡陣列

第3部分：光學特性測試方法

Opticsandphotonics—Microlensarrays—

Part3:Testmethodsforopticalproperties

（ISO14880?3:2006，Opticsandphotonics—Microlensarrays—

Part3:Testmethodsforopticalpropertiesother

thanwavefrontaberrations，MOD）

2024-11-28發(fā)布2025-06-01實施

國家市場監(jiān)督管理總局發(fā)布

國家標準化管理委員會

GB/T41869.3—2024

目次

前言

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Ⅲ

引言

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Ⅳ

1

范圍

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1

2

規(guī)范性引用文件

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1

3

術語和定義

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1

4

波前像差測試

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1

5

焦距測試

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1

5.1

概述

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1

5.2

測試原理

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2

5.3

測試系統(tǒng)

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2

5.4

測試準備

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3

5.5

測試程序

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3

6

色差測量

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3

7

焦點位置均勻性測量

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4

7.1

概述

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4

7.2

測試原理

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4

7.3

測試系統(tǒng)

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5

7.4

測試程序

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5

8

測試結(jié)果的不確定度分析

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5

9

測試報告

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5

附錄A（規(guī)范性）波前像差的測量

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7

附錄B（規(guī)范性）共焦成像法測量有效焦距

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9

附錄C（資料性）耦合效率和成像質(zhì)量

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11

參考文獻

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12

Ⅰ

GB/T41869.3—2024

前言

本文件按照GB/T1.1—2020《標準化工作導則第1部分：標準化文件的結(jié)構和起草規(guī)則》的規(guī)

定起草。

本文件是GB/T41869《光學和光子學微透鏡陣列》的第3部分，GB/T41869已經(jīng)發(fā)布了以下

部分：

—第1部分：術語；

—第2部分：波前像差的測試方法；

—第3部分：光學特性測試方法；

—第4部分：幾何特性測試方法。

本文件修改采用ISO14880?3：2006《光學和光子學微透鏡陣列第3部分：除波前像差外的光

學特性測試方法》。

本文件與ISO14880?3：2006相比做了下述結(jié)構調(diào)整：

—5.1對應ISO14880?3：2006的5.1和5.2.1；

—5.2對應ISO14880?3：2006的5.2.1；

—5.3對應ISO14880?3：2006的5.2.2；

—5.4對應ISO14880?3：2006的5.3；

—5.5對應ISO14880?3：2006的6.1和6.2；

—第6章對應ISO14880?3：2006的6.3；

—第7章對應ISO14880?3：2006的6.4和附錄D；

—第8章對應ISO14880?3：2006的第7章和第8章。

本文件與ISO14880?3:2006的技術差異及其原因如下：

—用規(guī)范性引用的GB/T41869.1代替了ISO14880?1（見第3章），以適應我國的技術條件；

—刪除了基板測試方法及其規(guī)范性引用的ISO10110?5（見ISO14880?3：2006的第4章），增加

了波前像差測試方法及其規(guī)范性引用的GB/T41869.2（見第4章），以適應我國的技術條件；

—更改了公式（2）（見第6章），以適應我國的技術條件、增加可操作性，也符合國際慣例；

—更改了附錄A的性質(zhì)（見附錄A），與正文中規(guī)范性引用的方法相對應。

本文件做了下列編輯性改動：

—為與現(xiàn)有標準協(xié)調(diào)，將標準名稱改為《光學和光子學微透鏡陣列第3部分：光學特性測試

方法》；

—刪除了附錄A中A.1和A.3的注。

請注意本文件的某些內(nèi)容可能涉及專利。本文件的發(fā)布機構不承擔識別專利的責任。

本文件由中國機械工業(yè)聯(lián)合會提出。

本文件由全國光學和光子學標準化技術委員會（SAC/TC103）歸口。

本文件起草單位：中國兵器工業(yè)標準化研究所、電子科技大學、安徽光智科技有限公司、船舶信息

研究中心（中國船舶集團有限公司第七一四研究所）、福建福特科光電股份有限公司、浙江偉星光學股

份有限公司、江蘇曙光光電有限公司、浙江水晶光電科技股份有限公司、艾普光學科技（廈門）有限公

司、寧波明星科技發(fā)展有限公司、武漢驛路通科技股份有限公司、深圳市深大極光科技股份有限公司。

本文件主要起草人：杜夢影、姜佳麗、尹士平、趙玥、朱元強、李斌成、汪松、吳建斌、

袁建奇、金利劍、馬孟鴻、土克旭、張祥波、黃燕燕。

Ⅲ

GB/T41869.3—2024

引言

微透鏡陣列是陣列光學器件中一類重要的光學元件，以單個透鏡，兩個或多個透鏡陣列的形式，廣

泛應用于三維顯示、與陣列光輻射源和光探測器相關的耦合光學、增強液晶顯示和光并行處理器元件。

隨著科技不斷進步，有必要制定一套技術內(nèi)容與國際接軌的國家標準，這樣既有利于推動我國微透

鏡陣列行業(yè)規(guī)范有序發(fā)展，又能更好地促進相關領域的貿(mào)易、交流和技術合作。GB/T41869《光學和

光子學微透鏡陣列》就是在此背景下起草制定的，微透鏡陣列標準擬由以下4個部分組成。

—第1部分：術語。目的在于通過定義微透鏡及其陣列的基本術語，促進微透鏡陣列產(chǎn)品的應

用，有助于科研工作和行業(yè)從業(yè)者在共同理解的基礎上交流概念。

—第2部分：波前像差的測試方法。目的在于通過規(guī)范波前像差的測試方法，明確微透鏡的基本

性能特征。

—第3部分：光學特性測試方法。目的在于通過規(guī)范主要光學特性指標的測試方法，提高不同供

應方產(chǎn)品的兼容性和互換性，促進微透鏡陣列技術進步。

—第4部分：幾何特性測試方法。目的在于通過規(guī)范主要幾何特性指標的測試方法，規(guī)范不同供

應商產(chǎn)品性能的一致性，拓展其應用領域。

Ⅳ

GB/T41869.3—2024

光學和光子學微透鏡陣列

第3部分：光學特性測試方法

1范圍

本文件規(guī)定了微透鏡陣列中微透鏡光學特性的測試原理、測試系統(tǒng)、測試準備，描述了測試程序及

測試結(jié)果處理。

本文件適用于表面幾何結(jié)構形成的微透鏡陣列和梯度折射率產(chǎn)生的微透鏡光學特性的測試。

2規(guī)范性引用文件

下列文件中的內(nèi)容通過文中的規(guī)范性引用而構成本文件必不可少的條款。其中，注日期的引用文

件，僅該日期對應的版本適用于本文件；不注日期的引用文件，其最新版本（包括所有的修改單）適用

于本文件。

GB/T41869.1光學和光子學微透鏡陣列第1部分：術語（GB/T