常見(jiàn)可靠性與環(huán)境試驗(yàn)

1、可靠性與環(huán)境試驗(yàn)之元器件篩選常見(jiàn)設(shè)計(jì)及參數(shù)電容器高溫老煉檢測(cè)系統(tǒng)Capacitor High Temperature Burn-In Test System型號(hào)：SPCP-T溫度范圍：環(huán)境溫度+150C老煉區(qū)及試驗(yàn)通道：4個(gè)實(shí)驗(yàn)區(qū)、16個(gè)試驗(yàn)通道試驗(yàn)工位：640個(gè)老煉試驗(yàn)電源：4臺(tái)，可擴(kuò)展為16臺(tái)，輸出100V、300V、600V、1000V等規(guī)格電壓：0V1000VSpecification: SPCP-TTemperature Range: RT 150CBurn-In Area and Test Channels: 4 test areas, 16 test channelsTest S

2、tation: 640Power Supply: 4, can be expanded to 16, the output of100V, 300V, 600V, 1000V and other specificationsVoltage: 0V 1000V集成電路高溫動(dòng)態(tài)老煉系統(tǒng)IC High Temperature Dynamic Burn-In System型號(hào)：SPIC-T溫度范圍：環(huán)境溫度+150C老煉區(qū)及試驗(yàn)通道：整機(jī)設(shè)置16個(gè)區(qū)域，每個(gè)區(qū)域?qū)?yīng)一個(gè)老煉試驗(yàn)通道試驗(yàn)工位：提供16板X208位/板=3328個(gè)試驗(yàn)工位驅(qū)動(dòng)控制板：16塊、64路數(shù)字信號(hào)、4路模擬信號(hào)、4路程控二級(jí)試驗(yàn)電

3、源Specification： SPIC-TTemperature Range: RT 150CBurn-In Area and Test Channels: 16 test areas, one test areascorresponds to one test channelTest Station: 16 (panels) X 208 (bit per panel ) =3328 test stationsDrive Control Panels : 16 panels , 64 digital signal, 4 analog signal, 4 secondary distance

4、control test power supplies高溫反偏老煉檢測(cè)系統(tǒng)High Temperature Anti Burn-In Test System型號(hào):SPFP-T溫度范圍:環(huán)境溫度+150C老煉區(qū)及試驗(yàn)通道:12通道試驗(yàn)工位:整機(jī)同時(shí)可插12塊試驗(yàn)板，總計(jì)74個(gè)/塊X12塊=888個(gè)檢測(cè)試驗(yàn)工位（單電源），20個(gè)/塊X12塊=240個(gè)檢測(cè)試驗(yàn)工位（單電源）老煉試驗(yàn)電源:3臺(tái)，可擴(kuò)展為10臺(tái)檢測(cè)控制板:12塊，老煉電壓檢測(cè)范圍0V1500V漏電流檢測(cè)范圍：100nA50mASpecification: SPFP-TTemperature Range: RT+150CBurn-In A

5、rea and Test Channels: 12 test channelsTest Station: 12 panels,74( bit per panel )X12 (panel)=888 test stations (single power supply ),20( bit per panel n) X12 (panel)=240 test stations (single power supply)Power Supply: 3, can be expanded to 10Drive Control Panels: 12Voltage: 01500VLeakage Current:

6、 100nA50mA擁有電容器高溫老煉檢測(cè)系統(tǒng)、集成電路高溫動(dòng)態(tài)老煉系統(tǒng)、高 溫反偏老煉檢測(cè)系統(tǒng)、晶體管特性圖示儀、大功率數(shù)字存儲(chǔ)圖示儀、 數(shù)字電橋、正向壓降測(cè)試儀、漏電流測(cè)試儀、直流低阻測(cè)試儀等試驗(yàn) 設(shè)備和測(cè)試儀器，可開(kāi)展電阻、電容、電感、半導(dǎo)體分立器件等元器 件的老煉篩選和性能測(cè)試，能夠滿足GJB、AEC和MIL-STD等系列標(biāo)準(zhǔn) 的要求，廣電計(jì)量可靠性與環(huán)境試驗(yàn)擁有上述設(shè)備及能力。GERTC has high temperature burn-in system for capacitor, high temperature dynamic burn-in system and high

7、 temperature reverse bias burn-in system for integrated circuit, transistor characteristics curve tracer, high power digital storage curve tracer, digital electric bridge, forward voltage drop tester, leaking current tester, DC low resistance tester, etc, with which we can carry out burn-in screening and performance test for resistor, capacitor, inductors,semiconduct