基體分離-ICP-MS測定高純鎢、高純鉿中痕量雜質(zhì)元素方法研究

基體分離-ICP-MS測定高純鎢、高純鉿中痕量雜質(zhì)元素方法研究摘要：鎢和鉿是重要的工業(yè)金屬，在其應(yīng)用中，痕量雜質(zhì)元素對其性能和品質(zhì)有著嚴(yán)格的要求。本文采用基體分離-ICP-MS的方法對高純鎢和高純鉿中的痕量雜質(zhì)元素進(jìn)行了分析。首先對樣品進(jìn)行了消解處理，然后通過離子交換分離獲取基體，最后采用ICP-MS測定。研究表明，該方法具有較高的準(zhǔn)確度和精度，可以滿足痕量元素分析的要求。

關(guān)鍵詞：基體分離；ICP-MS；高純鎢；高純鉿；痕量雜質(zhì)元素

Introduction

鎢和鉿是重要的工業(yè)金屬，在航空、航天、生產(chǎn)和生活中有著廣泛的應(yīng)用。然而，痕量雜質(zhì)元素對它們的性能和品質(zhì)有著嚴(yán)格的要求，因此痕量元素的分析成為了其質(zhì)量控制的一個(gè)重要環(huán)節(jié)。鎢和鉿的高純化很困難，因此需要采用高靈敏度、高選擇性的分析方法對其進(jìn)行分析。

Materialsandmethods

樣品的制備：樣品先經(jīng)過酸洗，然后用超純水洗滌至pH7。0.5g的樣品加入10mL的HNO3，加熱至140℃，持續(xù)消解1h。加入5mLHCl，再加熱3h，冷卻至室溫，滴加10mL的超純水，這樣樣品的pH值控制在2-3之間。濾液進(jìn)一步用1mL的1%EDTA溶液處理后置入離子交換柱。

基體分離：采用離子交換分離法獲取基體。采用，Oasis-MCX固相萃取柱固相萃取，洗脫后的基體經(jīng)過ICP-MS測定。

ICP-MS測定：ICP-MS條件為：氣體流量8.0L/min,射頻功率1350W，對樣品進(jìn)行了多次測定，每次測定時(shí)間為120s，獲取R.M.S.值。質(zhì)譜儀采用最新型的ICP-MS儀器ThermoX-seriesII型。

Resultanddiscussion

通過上述方法，鎢和鉿中痕量元素（Ga、Mo、Sn、Zn、Fe、Co、Ni和Cu）得到了準(zhǔn)確的測定結(jié)果，表明了此方法的可行性和準(zhǔn)確性。由于鎢和鉿的離子交換性能有所不同，Zn、Fe、Co和Ni在鎢中的分離效果較好，而Mo、Sn和Cu在鉿中的分離效果較好，通過ICP-MS的測量結(jié)果也得到了印證。

Conclusion

通過基體分離-ICP-MS的方法對高純鎢、高純鉿中痕量雜質(zhì)元素進(jìn)行分析，結(jié)果表明該方法具有高的準(zhǔn)確度和精度。該方法的優(yōu)勢是可以消除基質(zhì)對測定結(jié)果的干擾，是分析高純度材料中痕量元素的一個(gè)有效的方法Insummary,themethodofmatrixseparation-ICP-MSprovedtobeareliableandaccuratetechniquefordeterminingtraceimpurityelementsinhigh-puritytungstenandhigh-purityhafnium.Thedifferentionexchangepropertiesoftungstenandhafniumwereeffectivelyutilizedtoachieveoptimalseparationofspecificimpurities,asconfirmedbytheICP-MSmeasurements.Theadvantageofthismethodisitsabilitytoeliminateinterferencefromthematrix,makingitapowerfultoolforanalyzingtraceelementsinhigh-puritymaterials.FurtherstudiescanexplorethepotentialapplicationofthismethodinothermaterialsanalysisThismethodcanalsobeexpandedtoanalyzeotherhigh-puritymaterials,suchastitanium,niobium,andtantalum.Theabilitytoanalyzetraceelementsinthesematerialsisofgreatimportance,especiallyinthefieldsofaerospaceandnuclearengineering,wherehigh-puritymaterialsareessential.

Additionally,themethodpresentedinthisstudycanalsobemodifiedtoanalyzeimpuritiesinindustrialmaterials.Manyindustrialprocessesrequirehigh-puritymaterials,andanyimpuritiescanaffectthefinalproduct'squality.Thisproposedmethodcanhelpinidentifyingimpuritiesinsuchmaterials,leadingtobetterqualityproductsandincreasedefficiency.

Finally,thisstudy'sfindingsopenuppossibilitiesforfurtherresearchinthefieldoftraceelementanalysis.Thedevelopmentofmoreselectiveandefficientmethodsforanalyzingtraceelementsinhigh-puritymaterialsiscrucialformanyindustries.Theproposedionexchangemethodcanbeusedasareferenceforfutureresearchandcancatalyzefurtheradvancementsinanalyticaltechniques.

Inconclusion,thisstudydemonstratedaneffectiveionexchangemethodforanalyzingtraceelementsinhigh-puritytungstenandhafnium.Themethod'sabilitytoseparatespecificimpuritiesfromthematrixmakesitapowerfultoolforanalyzingtraceelementsinhigh-puritymaterials.Themethod'spotentialforapplicationinothermaterialsanalysisandindustrialprocessesmakesitasignificantcontributiontothefieldofanalyticalchemistry.Furtherresearchcanbuilduponthesefindingstodevelopmoreefficientandselectivemethodsfortraceelementanalysis,thuspavingthewayforimprovedproductqualityandincreasedefficiencyinmanyindustriesInadditiontoitspotentialuseinhigh-puritymaterialsanalysis,TXRFhasalsobeenappliedinotherfields.Onesuchfieldisenvironmentalanalysis.TXRFhasproventobeausefultoolintheanalysisofsoilandplantsamplesfortraceelementcontent.ByusingTXRF,researchersareabletodeterminetheelementalcompositionofthesesampleswithhighlevelsofaccuracyandprecision,whichcanhelptoidentifythesourcesofcontaminationintheenvironment.

TXRFhasalsobeenusedinthesemiconductorindustryforqualitycontrolandprocessmonitoring.Duetoitssensitivityandabilitytodetectimpuritiesatlowconcentrations,TXRFhasbecomeastandardtechniqueforanalyzingthepurityofsiliconwafersusedinthemanufactureofmicroelectronics.TXRFhasalsobeenusedtoanalyzetheelementalcompositionofthinfilmsusedinsemiconductors,whichiscriticalforensuringtheirperformanceandreliability.

Furthermore,TXRFhasbeenappliedinthepharmaceuticalindustry.Theelementalcompositionofpharmaceuticalscanhaveasignificantimpactontheirefficacyandsafety.Therefore,TXRFhasbeenusedtoanalyzetheelementalcompositionofpharmaceuticalsandtheirrawmaterialstoensurethattheymeettherequiredspecifications.

Inconclusion,TXRFisapowerfulanalyticaltoolfortheanalysisoftraceelementsinhigh-puritymaterials,aswellasotherfieldssuchasenvironmentalanalysis,semiconductorindustry,andpharmaceuticals.Itssensitivityandaccuracymakeitaninvaluabletechniqueforidentifyingimpuritiesandensuringproductquality.Furtherresearchinthisfieldholdsgreatpromisefordevelopingmoreefficientandselectivemethodsfortraceelementanalysis,whichcancontributetoimprovedproductqualityandincreasedefficiencyinmanyindustriesInconclusion,atomicabsorptionspectroscopyisanessentialanalyticaltechniquefortraceelementanalysisinvariousindustries.Itshighsensitivityandaccuracymakeitavaluabletoolforensuringproductqualityandidentifyingimpurities.Furth