數(shù)據(jù)采集與傳輸系統(tǒng)的設(shè)計與實現(xiàn)

畢業(yè)設(shè)計（論文）題目數(shù)據(jù)采集與傳輸系統(tǒng)的設(shè)計與實現(xiàn)院（系）信息科學(xué)與工程學(xué)院電子系專業(yè)電子信息工程屆別學(xué)號姓名指導(dǎo)老師#路（ASIC）,加固工藝的器件需要確定如何驗證設(shè)計程序庫而不是設(shè)備硬度。也就是說，有了測試芯片，我們是不是就可以在未來器件上使用相同的程序庫了？試想，如果賣主A的設(shè)計的新的固化工藝程序庫可移植性可比賣主B和C的都好，那么A設(shè)計，測試的測試芯片就是可接受的了。9個月后，美國航天局飛行項目就會使用賣主A的程序庫設(shè)計了新器件進行組合了。這是否需要完成輻射條件測試？回答這個問題之前，先看一下其他的問題。如何完整地測試芯片？所有程序庫元素來驗證每個單元是否有足夠的統(tǒng)計覆蓋？如果美國航天局新的設(shè)計部分使用了設(shè)計程序庫或使用了沒有充分描述的部分，可能就需要全部測試了。當(dāng)然，如果固化的部分工藝依靠一個進程的固有抗輻射硬度，也可以放棄一些測試（如SEL早先的樣本）。另外，其他考慮因素還包括運作速度和工作電壓。例如，如果在電源電壓3.3V的條件下，用測試芯片靜態(tài)地測試單粒子效應(yīng)，所測得的數(shù)據(jù)在電源電壓2.5V操作頻率100MHz的條件下是否適用？動態(tài)因素（即非靜態(tài)操作）包括單粒子瞬變（SETs）的普及效果。更高的頻率可能更關(guān)注這些。需要考慮的因素是，設(shè)計程序庫，測試范圍，鑄造特點必須是已知的，并且深刻理解測試用途。如果所有這些因素都已經(jīng)具備或測試芯片已被驗證，那么測試就沒有必要了。美國航天局的電子零件封裝（NEPP）計劃是為了探討這些因素的類型。用8051單片機評估加固工藝由于性能的不斷提高和功耗的不斷降低，微控制器在美國航天局和國防部的系統(tǒng)設(shè)計上的應(yīng)用正越來越多?，F(xiàn)在，美國航天局和國防部計劃正在不斷地改進固化工藝。微控制器是一個這樣的工具，正在深入量化抗輻射固化的改進。這些計劃的實例是Mission研究公司（MRC）與高級微電子研究所（這項研究的重點）所研制的8051微控制器。在自然空間輻射環(huán)境中，由于這些固化工藝的使用，美國宇航局在航天飛行中系統(tǒng)中使用驗證技術(shù)成為必要。8051單片機是一個行業(yè)標準架構(gòu)，被廣泛接受和應(yīng)用，并作為一種開發(fā)工具。有許多工業(yè)供應(yīng)商，他們供應(yīng)這種控制器或把這種控制器集成到某種類型的系統(tǒng)芯片的結(jié)構(gòu)。醫(yī)學(xué)研究理事會和高級微電子研究所都選擇這個設(shè)備，但他們論證的是兩種截然不同固化工藝。醫(yī)學(xué)研究理事會的實例是使用時間鎖存，需要具體時間以確保單粒子效應(yīng)減少到最低限度。高級微電子研究所采用超低功耗，以及布局和建筑固化工藝的設(shè)計原則來實現(xiàn)其結(jié)果。這些是與Aeroflex聯(lián)合技術(shù)微電子中心（UTMC）完全不同的方法，抗輻射固化的8051的工業(yè)供應(yīng)商，利用抗輻射固化進程研制自己的8051單片機。一臺設(shè)備廣泛涉及的技術(shù)使得8051成為技術(shù)評價的理想載體這項工作的目標是從高級微電子研究所得到CMOS超低功耗輻射容錯進程的技術(shù)評價[3]。其他兩個過程--英特爾的8051商業(yè)設(shè)備標準和采用國家最先進的加工從達拉斯半導(dǎo)體版本—是這個進程的基礎(chǔ)，。商業(yè)研究一一比較了他們的成本效益，性能和可靠性。技術(shù)性能的評價是為測試微控制器開發(fā)硬件和軟件。完備進程中目的是優(yōu)化測試過程以盡可能獲得完整的評價。這包括利用現(xiàn)有的硬件和在微控制器上運行的軟件對所有子處理器進行評價。這個進程還會使我們較完整地理解如何測試復(fù)雜的結(jié)構(gòu)，如微控制器，以及將來如何更有效地測試這些結(jié)構(gòu)。測試裝置這一試驗的評價使用了三款器件。首先是美國航天局的設(shè)備，這是進行評估主要設(shè)備。其他兩個設(shè)備是兩種版本的商業(yè)8051，分別由英特爾公司和美國達拉斯半導(dǎo)體制造。英特爾的設(shè)備是無存儲器型，這是經(jīng)典的8052MCS-51單片機電路版。他們工作環(huán)境是額定電壓+5伏，溫度范圍在0至70°C,時鐘頻率為3.5兆赫至24兆赫。他們由英特爾P629.0CHMOSIII-E進程制造的。達拉斯半導(dǎo)體器件都很相似因為他們都是ROMless8052單片機，但他們加強方式不同。他們的額定電壓從4.25至5.5,溫度在0到70°C,時鐘頻率高達25兆赫。第二次全內(nèi)置串口，增設(shè)七個中斷，一個看門狗定時器，一個掉電復(fù)位，雙數(shù)據(jù)指針和變速外設(shè)訪問。此外，重新設(shè)計技術(shù)核心，最終使該機器周期縮短，從而得到有效的處理能力，這大約是2.5倍（快）比標準的8052器件。不同于器件工作所固有的功能，這些功能沒有被利用是為了達拉斯和英特爾的測試代碼最大限度地相似。CMOS設(shè)備是MSC-51系列的一個版本，與超低功耗（ULP）進程代工許可的C8051HDL核心兼容。C8051設(shè)備在電源電壓為500毫伏運行，高壓部分包括一個片上輸入/輸出信號電平轉(zhuǎn)換接口。超低功耗輻射容錯技術(shù)C8051設(shè)備需要兩個單獨的電源電壓；500毫伏和理想的接口電壓。C8051是ROMless與MSC-51系列指令系統(tǒng)兼容的。五，測試硬件8051被測設(shè)備（DUT）作為實用電腦組成部分進行了測試。除了被測設(shè)備本身，在被測設(shè)備計算機其他組成部分從立即地區(qū)輻射光束被刪除。一個獨特的硬連線標識符字節(jié)所帶有的小卡（每種被測設(shè)備封裝類型有一個）控制被測設(shè)備，晶體，并旁路電容器（和電壓電平轉(zhuǎn)換為被測設(shè)備）。這種“被測設(shè)備板”是由短60導(dǎo)體帶狀電纜連接到“主板”。各主板的所有其他組件需要被測設(shè)備計算機完成，包括在一些設(shè)計名義上是沒有必要的組件（如外部內(nèi)存，外部ROM和地址鎖存器）。被測設(shè)備計算機和測試控制計算機是由串行電纜連接，而兩者之間的通信由控制器（即運行定制的串行接口軟件）建立。這個控制器軟件涉及被測設(shè)備的命令，被測設(shè)備碼的下載，和被測設(shè)備輻射前后搜集來的實時錯誤。1赫茲信號源為被測設(shè)備提供了一個外部看門狗定時信號，其看門狗輸出是通過一個示波器監(jiān)測。監(jiān)測電源供應(yīng)來得到閉鎖指示。六測試軟件8051測試軟件的概念很簡單。它的目的是要作為一個模塊化設(shè)計，為被測設(shè)備的每一個具體部分的設(shè)計一系列小型試驗程序。因為每個試驗是獨立的，他們是獨立加載的，在被測設(shè)備也是相互獨立執(zhí)行的。這將確保在測試時只有8051被測設(shè)備所需的部分在運行，并有助于測試時發(fā)生錯誤的精確定位。全部測試程序先駐存在控制器電腦中，然后通過串行接口加載到被測設(shè)備計算機。這樣，個別試驗可以在任何時間被修改。還可以制定和補充額外的測試，而不會影響整體測試設(shè)計。只有駐存在被測設(shè)備永久編碼，是啟動代碼和在控制器PC與被測設(shè)備建立之間的通信的串行代碼裝入例行程序。所有執(zhí)行的測試程序：?外部通用異步接收和發(fā)送裝置（UART接口），用來傳送錯誤信息和控制器計算機之間的通信。?外部實時時鐘，作為數(shù)據(jù)錯誤標記。?看門狗，必要時為8051正常運行和重新啟動的可視化確認提供測試代碼。?“混亂”的例行程序，如果它偏離代碼空間就會重置程序計數(shù)器。?外部遙測數(shù)據(jù)存儲器，數(shù)據(jù)傳輸發(fā)生中斷時提供的數(shù)據(jù)備份。應(yīng)當(dāng)指出的是，考慮到所有接收數(shù)據(jù)最高的可靠性，每個試驗中，返回遙測（包括時間標記）被同時送往測試控制器和遙測內(nèi)存。每一個軟件測試使用簡要介紹如下：中斷這項測試用到6個可用中斷矢量圖中的4個來觸發(fā)例程（串行，外部，定時器0溢出，以及定時器1溢出），累加器定期地與一個已知值比較，然后啟動例行程序順序地修改累加器的值。意外值傳與寄存器信息一起傳送。邏輯這個測試進行了一系列的邏輯和數(shù)學(xué)計算，并提供三種類型的錯誤鑒定：1）加法/減法，2）邏輯運算，3）乘法/除法。計算和期望值的所有不匹配與其他有關(guān)寄存器信息一起傳送。存儲器這項測試間接地用0x55模式裝在內(nèi)部數(shù)據(jù)存儲器的地址D：0x20到D：0xff（或D：0x20到D：0x080為CMOS超低功耗輻射容錯被測設(shè)備）。當(dāng)出錯信息和寄存器值被傳送，不斷進行比較，糾正。程序計數(shù)器取不同的偏移地址時，該程序計數(shù)器是用來取常數(shù)的。常數(shù)與已知值進行比較，不匹配結(jié)果與有關(guān)寄存器信息一起傳送。寄存器這項測試程序裝在中的四（0,1,2,3）段的通用寄存器或者0xAA（段0和2）或0x55（段1和3）。模式交替為了測試狀態(tài)字（PSW）特殊功能寄存器，其中控制通用寄存器段的選擇。然后通用寄存器段，比較他們的預(yù)期值。所有不匹配被更正，錯誤信息傳送。特殊功能寄存器（SFR）這項測試使用可特殊功能寄存器21位中的12位的已知靜態(tài)值，然后不斷地比較已知值與當(dāng)前值。不匹配與已知值和錯誤信息被重新裝入。棧這項測試通過把操作數(shù)壓入和彈出堆棧進行運算。意外值由于堆棧的錯誤或堆棧指針本身和有關(guān)的寄存器信息被傳送。七測試方法通過執(zhí)行位于地址0x0000指令代碼來啟動被測設(shè)備計算機。起初，這個地址的設(shè)備是一個以前載有“開機/串行裝載機”代碼的可擦寫可編程只讀存儲器。此代碼初始化被測設(shè)備計算機及接口通過串行連接的計算機的控制，“測試控制器”。被測設(shè)備計算機下載測試代碼并把它放入程序代碼存儲器（位于被測設(shè)備計算機主板）。然后啟動電路，同時進行兩個功能：被測設(shè)備的復(fù)位線保持有效一段時間（大約10毫秒）；并且，駐存在程序碼RAM的測試代碼映射到地址0x0000（在被測設(shè)備計算機內(nèi)存空間該可擦寫可編程只讀存儲器將不再被訪問）。蘇醒后，從重置，通過執(zhí)行地址0x0000指令代碼再次啟動被測設(shè)備電腦，但這個時候，代碼不是啟動/串行裝入程序代碼，而是測試代碼。不論在被測設(shè)備計算機的功能性如何，測試控制計算機始終保留了強制重置/映射功能。因此，如果測試運行沒有一個單一事件功能中斷（SEFI）無論是被測設(shè)備計算機本身或測試控制器可以終止了測試，并允許執(zhí)行后測試功能。如果SEFI發(fā)生，測試控制器強制重新啟動到開機/串行裝入程序代碼然后執(zhí)行后的測試功能。在被測設(shè)備的任何測試，被測設(shè)備行使的部分功能（例如，寄存器操作或內(nèi)部RAM的檢查，或定時器操作）在最高利用可能，同時使最小定期報告的測試控制計算機轉(zhuǎn)達的被測設(shè)備計算機仍然起作用。如果此報告停止，測試控制器知道了，一個SEFI發(fā)生。這種定期的數(shù)據(jù)被稱為“遙測”。如果被測設(shè)備遇到了一個錯誤，不能中斷功能（例如，數(shù)據(jù)寄存器不匹配）通過描述的錯誤串口有發(fā)出一個更多的長篇報告，并繼續(xù)進行測試。ValidationandTestingofDesignHardeningforSingle

EventEffectsUsingthe8051MicrocontrollerAbstractWiththedearthofdedicatedradiationhardenedfoundries,newandnoveltechniquesarebeingdevelopedforhardeningdesignsusingnon-dedicatedfoundryservices.Inthispaper,wewilldiscusstheimplicationsofvalidatingthesemethodsforthesingleeventeffects(SEE)inthespaceenvironment.Topicsincludethetypesofteststhatarerequiredandthedesigncoverage(i.e.,designlibraries:dotheyneedvalidatingforeachapplication?).Finally,an8051microcontrollercorefromNASAInstituteofAdvancedMicroelectronics(IApE)CMOSUltraLowPowerRadiationTolerant(CULPRiT)designisevaluatedforSEEmitigativetechniquesagainsttwocommercial8051devices.IndexTermsSingleEventEffects,Hardened-By-Design,microcontroller,radiationeffects.I.INTRODUCTIONNASAconstantlystrivestoprovidethebestcaptureofsciencewhileoperatinginaspaceradiationenvironmentusingaminimumofresources[1,2].Witharelativelylimitedselectionofradiation-hardenedmicroelectronicdevicesthatareoftentwoormoregenerationsofperformancebehindcommercialstate-ofthe-arttechnologies,NASA'sperformanceofthistaskisquitechallenging.Onemethodofalleviatingthisisbytheuseofcommercialfoundryalternativeswithnoorminimallyinvasivedesigntechniquesforhardening.Thisisoftencalledhardened-by-design(HBD).Buildingcustom-typeHBDdevicesusingdesignlibrariesandautomateddesigntoolsmayprovideNASAthesolutionitneedstomeetstringentscienceperformancespecificationsinatimely,cost-effective,andreliablemanner.However,onequestionstillexists:traditionalradiation-hardeneddeviceshavelotand/orwaferradiationqualificationtestsperformed;whattypesoftestsarerequiredforHBDvalidation?TESTINGHBDDEVICESCONSIDERATIONSTestmethodologiesintheUnitedStatesexisttoqualifyindividualdevicesthroughstandardsandorganizationssuchasASTM,JEDEC,andMIL-STD-883.Typically,TID(Co-60)andSEE(heavyionand/orproton)arerequiredfordevicevalidation.SowhatisuniquetoHBDdevices?Asopposedtoa“regular”commercial-off-the-shelf(COTS)deviceorapplicationspecificintegratedcircuit(ASIC)wherenohardeninghasbeenperformed,oneneedstodeterminehowvalidatedisthedesignlibraryasopposedtodeterminingthedevicehardness.Thatis,byusingtestchips,canwe“qualify”afuturedeviceusingthesamelibrary?ConsiderifVendorAhasdesignedanewHBDlibraryportabletofoundriesBandC.Atestchipisdesigned,tested,anddeemedacceptable.NinemonthslateraNASAflightprojectentersthemixbydesigninganewdeviceusingVendorA'slibrary.Doesthisdevicerequirecompleteradiationqualificationtesting?Toanswerthis,otherquestionsmustbeasked.Howcompletewasthetestchip?Wastheresufficientstatisticalcoverageofalllibraryelementstovalidateeachcell?IfthenewNASAdesignusesapartiallyorinsufficientlycharacterizedportionofthedesignlibrary,fulltestingmightberequired.Ofcourse,ifpartoftheHBDwasrelyingoninherentradiationhardnessofaprocess,someofthetests(likeSELintheearlierexample)maybewaived.Otherconsiderationsincludespeedofoperationandoperatingvoltage.Forexample,ifthetestchipwastestedstaticallyforSEEatapowersupplyvoltageof3.3V,isthedataapplicabletoa100MHzoperatingfrequencyat2.5V?Dynamicconsiderations(i.e.,nonstaticoperation)includethepropagatedeffectsofSingleEventTransients(SETs).Thesecanbeagreaterconcernathigherfrequencies.Thepointoftheconsiderationsisthatthedesignlibrarymustbeknown,thecoverageusedduringtestingisknown,thetestapplicationmustbethoroughlyunderstoodandthecharacteristicsofthefoundrymustbeknown.Ifalltheseareapplicableorhavebeenvalidatedbythetestchip,thennotestingmaybenecessary.AtaskwithinNASA'sElectronicPartsandPackaging(NEPP)Programwasperformedtoexplorethesetypesofconsiderations.HBDTECHNOLOGYEVALUATIONUSINGTHE8051MICROCONTROLLERWiththeirincreasingcapabilitiesandlowerpowerconsumption,microcontrollersareincreasinglybeingusedinNASAandDODsystemdesigns.ThereareexistingNASAandDoDprogramsthataredoingtechnologydevelopmenttoprovideHBD.Microcontrollersareonesuchvehiclethatisbeinginvestigatedtoquantifytheradiationhardnessimprovement.Examplesoftheseprogramsarethe8051microcontrollerbeingdevelopedbyMissionResearchCorporation(MRC)andtheIApE(thefocusofthisstudy).AstheseHBDtechnologiesbecomeavailable,validationofthetechnology,inthenaturalspaceradiationenvironment,forNASA'suseinspaceflightsystemsisrequired.The8051microcontrollerisanindustrystandardarchitecturethathasbroadacceptance,wide-rangingapplicationsanddevelopmenttoolsavailable.Therearenumerouscommercialvendorsthatsupplythiscontrollerorhaveitintegratedintosometypeofsystem-on-a-chipstructure.BothMRCandIApEchosethisdevicetodemonstratetwodistinctlydifferenttechnologiesforhardening.TheMRCexampleofthisistousetemporallatchesthatrequirespecifictimingtoensurethatsingleeventeffectsareminimized.TheIApEtechnologyusesultralowpower,andlayoutandarchitectureHBDdesignrulestoachievetheirresults.ThesearefundamentallydifferentthantheapproachbyAeroflex-UnitedTechnologiesMicroelectronicsCenter(UTMC),thecommercialvendorofaradiation—hardened8051,thatbuilttheir8051microcontrollerusingradiationhardenedprocesses.Thisbroadrangeoftechnologywithinonedevicestructuremakesthe8051anidealvehicleforperformingthistechnologyevaluation.TheobjectiveofthisworkisthetechnologyevaluationoftheCULPRiTprocess[3]fromIApE.Theprocesshasbeenbaselinedagainsttwootherprocesses,thestandard8051commercialdevicefromIntelandaversionusingstate-of-the-artprocessingfromDallasSemiconductor.Byperformingthisside-by-sidecomparison,thecostbenefit,performance,andreliabilitytradestudycanbedone.Intheperformanceofthetechnologyevaluation,thistaskdevelopedhardwareandsoftwarefortestingmicrocontrollers.Athoroughprocesswasdonetooptimizethetestprocesstoobtainascompleteanevaluationaspossible.Thisincludedtakingadvantageoftheavailablehardwareandwritingsoftwarethatexercisedthemicrocontrollersuchthatallsubstructuresoftheprocessorwereevaluated.Thisprocessisalsoleadingtoamorecompleteunderstandingofhowtotestcomplexstructures,suchasmicrocontrollers,andhowtomoreefficientlytestthesestructuresinthefuture.TESTDEVICESThreedeviceswereusedinthistestevaluation.ThefirstistheNASACULPRiTdevice,whichistheprimarydevicetobeevaluated.Theothertwodevicesaretwoversionsofacommercial8051,manufacturedbyIntelandDallasSemiconductor,respectively.TheInteldevicesaretheROMless,CMOSversionoftheclassic8052MCS-51microcontroller.Theyareratedforoperationat+5V,overatemperaturerangeof0to70°Candataclockspeedsof3.5MHzto24MHz.TheyaremanufacturedinIntel'sP629.0CHMOSIII-Eprocess.TheDallasSemiconductordevicesaresimilarinthattheyareROMless8052microcontrollers,buttheyareenhancedinvariousways.Theyareratedforoperationfrom4.25to5.5Voltsover0to70°Catclockspeedsupto25MHz.Theyhaveasecondfullserialportbuiltin,sevenadditionalinterrupts,awatchdogtimer,apowerfailreset,dualdatapointersandvariablespeedperipheralaccess.Inaddition,thecoreisredesignedsothatthemachinecycleisshortenedformostinstructions,resultinginaneffectiveprocessingabilitythatisroughly2.5timesgreater(faster)thanthestandard8052device.Noneofthesefeatures,otherthanthoseinherentinthedeviceoperation,wereutilizedinordertomaximizethesimilaritybetweentheDallasandInteltestcodes.TheCULPRiTtechnologydeviceisaversionoftheMSC-51familycompatibleC8051HDLcorelicensedfromtheUltraLowPower(ULP)processfoundry.TheCULPRiTtechnologyC8051deviceisdesignedtooperateatasupplyvoltageof500mVandincludesanon-chipinput/outputsignallevel-shiftinginterfacewithconventionalhighervoltageparts.TheCULPRiTC8051devicerequirestwoseparatesupplyvoltages;the500mVandthedesiredinterfacevoltage.TheCULPRiTC8051isROMlessandisintendedtobeinstructionsetcompatiblewiththeMSC-51family.TESTHARDWAREThe8051DeviceUnderTest(DUT)wastestedasacomponentofafunctionalcomputer.AsidefromDUTitself,theothercomponentsoftheDUTcomputerwereremovedfromtheimmediateareaoftheirradiationbeam.Asmallcard(oneperDUTpackagetype)withauniquehard-wiredidentifierbytecontainedtheDUT,itscrystal,andbypasscapacitors(andvoltagelevelshiftersfortheCULPRiTDUTs).This"DUTBoard"wasconnectedtothe"MainBoard"byashort60-conductorribboncable.TheMainBoardhadallothercomponentsrequiredtocompletetheDUTComputer,includingsomewhichnominallyarenotnecessaryinsomedesigns(suchasexternalRAM,externalROMandaddresslatch).TheDUTComputerandtheTestControlComputerwereconnectedviaaserialcableandcommunicationswereestablishedbetweenthetwobytheController(thatrunscustomdesignedserialinterfacesoftware).ThisControllersoftwareallowedforcommandingoftheDUT,downloadingDUTCodetotheDUT,andreal-timeerrorcollectionfromtheDUTduringandpostirradiation.A1HzsignalsourceprovidedanexternalwatchdogtimingsignaltotheDUT,whosewatchdogoutputwasmonitoredviaanoscilloscope.Thepowersupplywasmonitoredtoprovideindicationoflatchup.TESTSOFTWAREThe8051testsoftwareconceptisstraightforward.ItwasdesignedtobeamodularseriesofsmalltestprogramseachexercisingaspecificpartoftheDUT.Sinceeachtestwasstandalone,theywereloadedindependentlyofeachotherforexecutionontheDUT.Thisensuredthatonlythedesiredportionofthe8051DUTwasexercisedduringthetestandhelpedpinpointlocationoferrorsthatoccurduringtesting.AlltestprogramsresidedonthecontrollerPCuntilloadedviatheserialinterfacetotheDUTcomputer.Inthisway,individualtestscouldhavebeenmodifiedatanytimewithoutthenecessityofburningPROMs.Additionaltestscouldhavealsobeendevelopedandaddedwithoutimpactingtheoveralltestdesign.Theonlypermanentcode,whichwasresidentontheDUT,wasthebootcodeandserialcodeloaderroutinesthatestablishedcommunicationsbetweenthecontrollerPCandtheDUT.Alltestprogramsimplemented:?AnexternalUniversalAsynchronousReceiveandTransmitdevice(UART)fortransmissionoferrorinformationandcommunicationtocontrollercomputer.?Anexternalreal-timeclockfordataerrortag.?Awatchdogroutinedesignedtoprovidevisualverificationof8051healthandrestarttestcodeifnecessary.?A"foul-up"routinetoresetprogramcounterifitwandersoutofcodespace.?Anexternaltelemetrydatastoragememorytoprovidebackupofdataintheeventofaninterruptionindatatransmission.Thebriefdescriptionofeachofthesoftwaretestsusedisgivenbelow.Itshouldbenotedthatforeachtest,thereturnedtelemetry(includingtimetag)wassenttoboththetestcontrollerandthetelemetrymemory,givingthehighestreliabilitythatalldataiscaptured.Interrupt—Thistestused4of6availableinterruptvectors(Serial,External,TimerOOverflow,andTimer1Overflow)totriggerroutinesthatsequentiallymodifiedavalueintheaccumulatorwhichwasperiodicallycomparedtoaknownvalue.Unexpectedvaluesweretransmittedwithregisterinformation.Logic—Thistestperformedaseriesoflogicandmathcomputationsandprovidedthreetypesoferroridentifications:1)addition/subtraction,2)logicand3)multiplication/division.Allmiscomparesofcomputationsandexpectedresultsweretransmittedwithotherrelevantregisterinformation.Memory—ThistestloadedinternaldatamemoryatlocationsD:0x20throughD:Oxff(orD:Ox2OthroughD:OxO8OfortheCULPRiTDUT),indirectly,withanOx55pattern.Compareswereperformedcontinuouslyandmiscompareswerecorrectedwhileerrorinformationandregistervaluesweretransmitted.ProgramCounter-Theprogramcounterwasusedtocontinuouslyfetchconstantsatvariousoffsetsinthecode.Constantswerecomparedwithknownvaluesandmiscomparesweretransmittedalongwithrelevantregisterinformation.Registers—Thistestloadedeachoffour(0,1,2,3)banksofgeneral-purposeregisterswitheitherOxAA(forbanksOand2)orOx55(forbanks1and3).ThepatternwasalternatedinordertotesttheProgramStatusWord(PSW)specialfunctionregister,whichcontrolsgeneral-purposeregisterbankselection.General-purposeregisterbankswerethencomparedwiththeirexpectedvalues.Allmiscompareswerecorrectedanderrorinformationwastransmitted.SpecialFunctionRegisters(SFR)—Thistestusedlearnedstaticvaluesof12out21availableSFRsandthenconstantlycomparedthelearnedvaluewiththecurrentone.Miscompareswerereloadedwithlearnedvalueanderrorinformationwastransmitted.Stack—Thistestperformedarithmeticbypushingandpoppingoperandsonthestack.Unexpectedresultswereattributedtoerrorsonthestackortothestackpointeritselfandweretransmittedwithreleva