基于DS18B20的溫度探測系統(tǒng)外文翻譯[優(yōu)選材料]

1、附件1：外文資料翻譯譯文一種基于DS18B20的溫度探測系統(tǒng)摘要所有的DS18B20傳感器，用于多點溫度測試，IO總線與MCU連接，溫度數(shù)據(jù)的輪流收集。如果系統(tǒng)有大量的傳感器，MCU的時間用在處理溫度數(shù)據(jù)明顯延長，因此周期替代測試變得更長。在本文中，一種新的方法，DS18B20的合理組合和一些在軟件上采取的措施，替代試驗進(jìn)展速度明顯。關(guān)鍵詞：DS18B20的集團(tuán)，溫度測試，輪流測試所花費的時間。引言由于結(jié)構(gòu)簡單，安裝方便，低損失和廣泛的用途的溫度測試，DS18B20溫度測試傳感器應(yīng)用領(lǐng)域，需要多點溫度測試，如化學(xué)工業(yè)，糧食，環(huán)境監(jiān)督管理等。因為通過一個DS18B20的多點溫度測試系統(tǒng)總線，所有

2、DS18B20是掛在一條總線上，然后每個溫度測試點的值轉(zhuǎn)換輪流讀。作為轉(zhuǎn)換后讀值必須閱讀8次引腳的狀態(tài)，移動時間，位置和存儲數(shù)據(jù)，所以時間多花費在閱讀每一個點的數(shù)據(jù)系統(tǒng)時間。如果溫度測試系統(tǒng)是大型系統(tǒng)由它造成的損失是相當(dāng)多的，然后交替測試系統(tǒng)的運行速度明顯降低，從而影響多點溫度測試系統(tǒng)的效率。在本文中，DS18B20的一些I / O總線上都掛著分組DS18B20的均勻，溫度轉(zhuǎn)換獲取數(shù)據(jù)讀取DS18B20的狀態(tài)， 系統(tǒng)損耗減少和替代測試速度增加顯然，這將不會影響精度和轉(zhuǎn)換的可靠性。一套點對多點溫度，在此實現(xiàn)人工環(huán)境實驗室測試，這增加了測試效率。作者對DS18B20的認(rèn)識DS18B20是單總線數(shù)字

3、溫度傳感器來自美國達(dá)拉斯公司。 DS18B20是由64數(shù)字光盤刻激光，溫度敏感性組成部分，非易失性溫度報警觸發(fā)器（設(shè)備TH和TL）。DS18B20的通信微處理器單總線端口和測試范圍DS18B20是從-55攝氏度到+125攝氏度，增量值是0.5攝氏度。溫度可在720ms的數(shù)字改為每個DS18B20具有唯一的64數(shù)字序號。圖1揭示的具體內(nèi)容：兩個8的數(shù)字儲量（0號和1號），用于存儲在DS18B20的溫度值。0號存儲存儲器溫度值，補充和一號存儲器溫度值的符號。用戶可以定義非揮發(fā)的溫度報警臺和區(qū)分報警搜索命令，并尋求組件溫度預(yù)定限額以外的報警狀態(tài)。有兩個電源的替代方法：信號總線的高級別借采用電源或+5

4、V外部電源直接采用。圖1 DS18B20的64位ROM應(yīng)用程序的分組試驗方法本文闡述了DS18B20與89C52接口的分組方法。假設(shè)量P1口的總線是和溫度測試系統(tǒng)需要100 DS18B20的傳感器，可以平均分配4 I / O線。如果傳感器的數(shù)量不能分割由總線數(shù)目甚至，傳感器的數(shù)量差距總線上是不超過一個，它可以處理，而閱讀數(shù)字。外部供電電源。擁有在每個DS18B20的同時性的轉(zhuǎn)換，激烈當(dāng)前是必要的，不能使用和信號總線電源，否則系統(tǒng)無法工作秩序。 “電路原理圖2所示（DS18B20的信號同組的公共汽車上都掛著P1口的一些公共汽車）。當(dāng)讀寫DS18B20的，嚴(yán)格的時間表被保留。首先回歸脈沖被發(fā)送到所

5、有DS18B20的。后回歸，跳過ROM命令發(fā)送到每個電路同時的I / O端口，轉(zhuǎn)換順序發(fā)送的，那么所有的傳感器開始轉(zhuǎn)變。轉(zhuǎn)換后，匹配ROM命令同時發(fā)送到每個電路，64位序列號發(fā)送。 DS18B20是每個選擇組，便簽數(shù)據(jù)讀取。最后的數(shù)據(jù)是轉(zhuǎn)化。串行讀取數(shù)據(jù)轉(zhuǎn)化為實際溫度值。一名候補測試完成后DS18B20溫度數(shù)據(jù)讀取完全由周期性的讀數(shù)為25倍。 圖2 DS18B20的分組示意圖現(xiàn)在，在單總線和分組分析法測試系統(tǒng)耗時分別說明?；貧w時間序列和時間序列的寫作和閱讀的一個位微處理器在數(shù)字4-6中顯示。DS18B20的回歸周期為495us，1020us;一位寫作時間是60us-120us;一位讀期間以上6

6、0us;寫入或讀取下位跨度是微秒。由于A / D轉(zhuǎn)換時間為97.35ms（9精密度），如果它是由最短的方法計算，替代測試總耗時分別計算如下：單總線：495us+2*(8*60+7)us+97.35ms+495us+100*(64*60+63+8*60+7+9*60+8)us=552.534ms分組模式：495us+2*(8*60+7)us+97.35ms+20(64*60+63+8*60+7+9*60+8)us=189.804ms作為數(shù)制轉(zhuǎn)換和存儲時間，在整個時期，未知的晶體振蕩器的頻率，數(shù)制轉(zhuǎn)換和存儲時間的一小部分是不計算在內(nèi)。因此，備用的測試分組模式消耗的時間明顯比單總線模式短得多。設(shè)計示

7、例瀝青運輸車輛是主要材料領(lǐng)域和道路之間的交通運輸設(shè)備表面。不可避免的溫度，減少因瀝青運輸車輛的長期工作和運輸距離影響的攤鋪質(zhì)量路面，必須采取具體措施，根據(jù)殼的熱釋放。本文設(shè)計了一套無線溫度使用DS18B20分組模式測試瀝青的溫度測試系統(tǒng)運輸車輛外殼，總積分為120。溫度測試系統(tǒng)軟件采用模塊化設(shè)計。下位機收集數(shù)據(jù)，存儲數(shù)據(jù)，建立的DS18B20，并發(fā)送無線模塊等。上位機采用PC機，主要接收溫度數(shù)據(jù)從下位機上位機顯示，存儲和管理數(shù)據(jù)。 A. 系統(tǒng)硬件考慮到多點溫度數(shù)臨時存儲期間相當(dāng)大的內(nèi)部RAM值的轉(zhuǎn)換，行政控制芯片采用ATMEL公司的89C52單片機256字節(jié)RAM和8KB的E2PROM程序存儲

8、。作為DS18S20區(qū)分代碼讀取和編號，液晶顯示模塊（敖克拉中國集成模塊OCMJ金鵬公司）和鍵盤模塊補充說。無線數(shù)字傳輸采用無線在整個接收發(fā)送形式375模塊，這5月有兩個業(yè)余頻段選擇和調(diào)節(jié)波特率（最大為20Kbit/ S），單芯片微機串口的數(shù)據(jù)可以直接接收。DS18B20與電源，分為8組掛在P1口（P1.0-P1.7口）。無線模塊掛在串口直接與硬件看門狗采用MAX813芯片。當(dāng)電源被添加到系統(tǒng)中，回歸信號傳輸?shù)腗AX813回歸針，價值回歸脈沖為200ms。當(dāng)過程中，必須被發(fā)送到一個脈沖信號MAX813世界發(fā)展指標(biāo)“沒有比間隔為1.6s到更多的引腳清除看門狗定時器。如果間隔超過為1.6s，針并沒

9、有收到脈沖信號，然后89C52必須扭轉(zhuǎn)。作為120DS18B20的序列號必須在系統(tǒng)中存儲，針對數(shù)據(jù)存儲DS1225（8K）停電。B. 系統(tǒng)軟件功能和過程溫度測試系統(tǒng)的軟件部分DS18B20的收集和轉(zhuǎn)換數(shù)據(jù)，執(zhí)行無線溝通，管理鍵盤等。對于方便程序的調(diào)試和可靠性，采用模塊設(shè)計，主要包括鍵盤處理模塊，無線通信模塊，溫度采集和處理，顯示模塊模塊等。外接電源回歸后，89C52首先自我檢查，然后分配給每個分支的程序模塊。主要的過程管理的鍵盤，系統(tǒng)初始化，傳輸各功能模塊。長途線保持執(zhí)行DS18B20的編輯任務(wù)。序號120點DS18B20是讀通過鍵盤和顯示器的協(xié)調(diào)到DS1225Y和編號。首先，無線模塊設(shè)置為接

10、收狀態(tài)接收收集參數(shù)和啟動順序（傳輸內(nèi)容包發(fā)送;相同的內(nèi)容發(fā)送三次;兩頭在外的三個邏輯執(zhí)行按位）。無線模塊設(shè)置為睡眠狀態(tài)，在在溫度的轉(zhuǎn)化率和轉(zhuǎn)化狀態(tài)數(shù)據(jù)傳輸。包裝發(fā)送溫度數(shù)據(jù)和DS18B20的數(shù)字上位機系統(tǒng)中。“收集和轉(zhuǎn)換的部分開始的DS18B20轉(zhuǎn)換，讀取溫度數(shù)據(jù)分組方法，數(shù)據(jù)存儲等。結(jié)論創(chuàng)建以下新思路1替代試驗多點的時間差溫度測試系統(tǒng)的分組方法和單總線的方法進(jìn)行了分析，然后交替的測試速度可大大提高了分組方法。2一套無線多點溫度測試系統(tǒng)設(shè)計DS18B20分組方法。這個系統(tǒng)是適用于瀝青運輸?shù)募夹g(shù)改革一些國內(nèi)大型工程機械車輛實現(xiàn)公司和應(yīng)用程序的好成績。參考文獻(xiàn)1ShenJin, SongJingL

11、ing. An All-digital Temperature Measuring System Used in Grain Barns. Transaction of the chese society for Agricultural Machinery,2001,(2):8991. 2 LiMinHui, Jung Deqiong. A Device of Temperature Measuremen Made up of DS1820 and AT89C205. Journal of Sichan NormalUniversity1997,(5):93-96 3 Qi ZhiCaiGa

12、i Shuang. Embedded Control System of the Central Air conditioner Room,InstrumentTechnique and Sensor 2002,(5):25-26. 4 ZhangPeiren ZhouYanping. A Large-Scale Temperature Alarm System Based on 1Wire Bus and CAN bus, Control&Automation 2003,(2):25-26 A Design of the Temperature Test System Basedon Gro

13、uping DS18B20AbstractAll the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, s

14、o the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly. Key words- DS18B20 Group, temperature test, time spent on the alternate test

15、.1. INTRODUCTION As the simple structure, convenient installment, low loss and wide range of temperature test, DS18B20 temperature test sensors are applied to the fields which need the multipoint temperature test, such as the chemical industry, the grain, the environment supervision and so on. Becau

16、se of the adoption of one bus in the DS18B20 multipoint temperature test system, all DS18B20 are hung on one bus, and then the temperature conversion value of each test point is read by turns. As the conversion value must be read after reading-pin state for 8 times, and position and store data must

17、be moved, so time spend much in reading one point of the data system by every time. If the temperature test system is large-scaled, the system loss caused by it is rather much, and then the alternate test speed of the system decreases obviously, which influences the efficiency of the multipoint temp

18、erature test system seriously. In this paper, DS18B20 are hung on some I/O buses by grouping DS18B20 evenly, and the conversion temperature data is obtained by reading the state of DS18B20, then the system loss decreases and the alternate test speed increases obviously, which wont influence the prec

19、ision and the reliability of the conversion. A set of multipoint temperature test of artificial environment laboratory is achieved in this paper, which increases the test efficiency of the former system.2. CHARACTERISTICS OF DS18B20 DS18B20 is the single bus digital temperature sensor from American

20、Dallas Company. DS18B20 is consisted of the 64 figures ROM engraved by laser, the temperature sensitivity component, non-volatile temperature alarms trigger (Device TH and TL).DS18B20 communicates with the microprocessor by the single bus port and the test range of DS18B20 is from -55 centigrade to

21、+125 centigrade, and the incremental value is 0.5 centigrade. The temperature can be changed into figures within 720ms and each DS18B20 has the sole 64 figures serial number.Fig 1 DS18B20 64bit ROMThe specific content is revealed as Fig 1: There are two 8 figures storages (No.0 and No.1) for storing

22、 temperature value in DS18B20. No.0 storage stores complement of the temperature value, and No.1 stores symbols of the temperature value. The user can define non-volatile temperature alarms sets and distinguish the alarms search order and seek the component temperature alarms state outside the sched

23、uled limit. There are two alternative ways of power supply: Signal bus high-level borrow power is adopted, or the +5v power supply externally is adopted directly.3. APPLICATION THE GROUPING TEST METHODThis paper illustrates the grouping method with the interface of DS18B20 and 89C52. Assuming the am

24、ount of the buses on P1 port is 4 and the temperature test system needs 100 DS18B20 sensors, which can be distributed equally to the 4 I/O lines. If the number of sensors cannot be divided by the number of buses even, the number disparity of sensors on buses is no more than one, which can be handled

25、 while reading numbers. The power is supplied externally. Owning to the synchronistic conversion in each DS18B20, the intense current is needed, and the signal bus cannot be used for the power supply, otherwise the system cannot work in order. The schematic circuit is shown as Fig 2 (the DS18B20 sig

26、nal buses of the same group are hung on some buses of P1 port). When read and write the DS18B20, the strict schedule must be kept. First a reversion pulse is sent to all DS18B20. After the reversion, Skip ROM order is sent to each circuit simultaneously from the I/O port, and the conversion order is

27、 sent, then all sensors begin transform. After the conversion, Match Rom order is sent to each circuit simultaneously, and 64 bits serial number is sent. DS18B20 is selected for each group, and Scratch Pad data is read. Finally the data is transformed. The data of serial-read is transformed into the

28、 actual temperature value. One alternate test is finished after the DS18B20 temperature data is read completely by the cyclical reading for 25 times.Fig 2 DS18B20 grouping sketch mapNow the time-consuming in the test system of the single bus and the grouping analyses method is illustrated respective

29、ly. The reversion time sequence and the time sequence of writing and reading one bit for the microprocessor are revealed in figures 4-6. The figure show: The reversion period of DS18B20 is 495us-1020us; the writing period of one bit is 60us-120us; the reading period of one bit is above 60us; the spa

30、n of writing or reading the next bit is 1us. As the A/D conversion time is 97.35ms (9 precisions), if it is counted by the shortest way, the total time-consuming of alternate test is calculated respectively as follows: (1) Single bus 495us+2*(8*60+7)us+97.35ms+495us+100*(64*60+ 63+8*60+7+9*60+8)us=5

31、52.534ms (2) Grouping mode 495us+2*(8*60+7)us+97.35ms+20(64*60+63+8*60+7+9*60+8)us=189.804msAs the small proportion of the numeration system conversion and the storage time in the whole period, the unknown crystal-oscillator frequency, the numeration system conversion and storage time is not counted

32、. Accordingly, the alternate test time which grouping mode consumes is much shorter than single bus mode obviously.4. EXAMPLE OF THE DESIGNThe asphalt transportation vehicle is the main transportation equipment between the material field and road surface. The unavoidable temperature decreasing becau

33、se of the asphalt transportation vehicles long working and transportation distance influences the paving quality of the road surface; the specific measures must be taken according to the heat release of the shell. This paper designed a set of wireless temperature using DS18B20 grouping mode test sys

34、tem for testing the temperature of the asphalt transportation vehicle shell, and the total points is 120. Temperature test system software adopts the modular design. The hypogenous machine collects data, stores data, sets up DS18B20, and sends the wireless module and so on. The epigenous machine ado

35、pts PC machines, mainly receives the temperature data from the hypogenous machine. The epigenous machine displays, stores and manages data. The simple communication between people and machines is performed by the epigenous machine. This paper will not illustrate the simple procedure of the epigenous

36、 machine in detail. The following is the illustration of parts of hypogenous machine.A.System hardwareConsidering the multipoint temperature number of the temporary storage and the considerable internal RAM during the value conversion, the chief controlling chip adopts ATMEL 89C52 Single-Chip Microc

37、omputer with 256 bytes RAM and 8KB E2PROM procedure storage. As the distinguishable code of DS18S20 is read and numbered, the liquid crystal module (Ao Kela Chinese integrated module of OCMJ Jin Peng Company) and the keyboard module are added. The wireless digital transmission adopts the wireless mo

38、dule375 in the whole reception-sending form, which may has two amateur bands to choose and the regulative Baud Rate ( the max is 20Kbit/s), and the Single-Chip Microcomputer serial port data can be received directly. DS18B20, with the power supply, divided into 8 groups hung on P1 port (P1.0-P1.7).

39、The wireless module is hung on serial port directly and the hardware watchdog adopts the MAX813 chip. When the power is added to the system, the reversion signal is transmitted from the MAX813 reversion pin, and the value of the reversion pulse is 200ms. When the procedure is in order, a pulse signa

40、l must be sent to MAX813 WDI pin in no more than the interval of 1.6s to clear away the watch-dog timer. If the interval is more than 1.6s, the pin does not receive the pulse signal, and then the 89C52 must be reversed. As 120 DS18B20 serial numbers must be stored in the system, the data storage DS1

41、225 (8K) against the power failure is developed.B.System software function and process The software part of the temperature test system numbers DS18B20, collects and transforms data, performs the wireless communication, manages keyboard and so on. For the convenience of the procedure debugging and t

42、he reliability, the module design is adopted, mainly including the keyboard processing module, the wireless communication module, the module of temperature collection and processing, the display module and so on. The chief procedure manages the keyboard, initializes the system and transfers each fun

43、ctional module. The haul line is kept to perform DS18B20 edit mission. 120 points serial number of DS18B20 is read by the keyboard and display coordination and numbered into DS1225Y. First the wireless module is set up as the reception state to receive the collection parameters and start the order (The transmission content is sent by pack ; the same content is sent for three times ; two out of three logic is performed according to the bit).The wireless module is set up as the sleep state during the conversion and the transforming state during the temperature data transmis